
Si550
2
Rev. 0.6
1. Electrical Specifications
Table 1. Recommended Operating Conditions
Parameter
Symbol
Test Condition
Min
Typ
Max
Units
Supply Voltage1
VDD
3.3 V option
2.97
3.3
3.63
V
2.5 V option
2.25
2.5
2.75
1.8 V option
1.71
1.8
1.89
Supply Current
IDD
Output enabled
LVPECL
CML
LVDS
CMOS
—
120
108
99
90
130
117
108
98
mA
tristate mode
—
60
75
Output Enable (OE)2
VIH
0.75 x VDD
——
V
VIL
——
0.5
Operating Temperature Range
TA
–40
—
85
°C
Notes:
2. OE pin includes a 17 k
resistor to VDD.
Table 2. VC Control Voltage Input
Parameter
Symbol
Test Condition
Min
Typ
Max
Units
Control Voltage Tuning Slope1,2,3
KV
10 to 90% of VDD
—33
45
90
135
180
356
—
ppm/V
Control Voltage Linearity4
LVC
BSL
–5
±1
+5
%
Incremental
–10
±5
+10
Modulation Bandwidth
BW
9.3
10.0
10.7
kHz
VC Input Impedance
ZVC
500
—
k
Nominal Control Voltage
VCNOM
@ fO
—VDD/2
—
V
Control Voltage Tuning Range
VC
0VDD
V
Notes:
2. For best jitter and phase noise performance, always choose the smallest KV that meets the application’s minimum APR
requirements. See “AN266: VCXO Tuning Slope (KV), Stability, and Absolute Pull Range (APR)” for more information.
3. KV variation is ±10% of typical values.
4. BSL determined from deviation from best straight line fit with VC ranging from 10 to 90% of VDD. Incremental slope
determined with VC ranging from 10 to 90% of VDD.